- Home
- About Us
- Products
- Rohmann Eddy Current
- Secu-Chek UV-LED Lamps
- Sonatest
- MR Chemie
- Hoffmann Tam Panels
- Desoutter Industrial Tools
- Novotest
- Integrated Design Tools (IDT Vision)
- Dakota NDT
- DeFelsko Corporation
- Sonotec Ultrasonic Solutions
- Sonotec Ultrasonic Hand-Tools
- G.A.L. Gage Company
- Western Instruments Inc.
- Esders Gas Technology
- Hinode Electric
- News
- Contact Us
 (65) 6878 0608  (65) 6878 0609 |
|
Equotip portable hardness testers – Leeb, Rockwell & UCI
|
Overcome the limitations of stationary bench top metal NDT hardness testing
Proceq’s Equotip enables portable hardness inspection of almost any object, polished parts and heat-treated surfaces. The hardness measurements are made by using the dynamic rebound testing method according to Leeb, the static Portable Rockwell hardness test and the Ultrasonic Contact Impedance (UCI) method. The rugged Swiss-made metal NDT hardness testers are designed for portable hardness testing in the lab, in the workshop, at production facilities or on site. Proceq’s latest innovation is Equotip Live featuring a wireless impact device, mobile app, real-time data sharing and cloud backup.
Since Proceq invented the Leeb hardness test principle in 1975, Equotip has become established as a globally recognized brand for portable hardness testing and a de facto industry standard. A wide range of different impact devices, as well as a comprehensive selection of test blocks and accessories cover most applications.
| Models |
Equotip Live UCI |
Equotip Live Leeb D |
Equotip 550 UCI |
Equotip 550 Portable Rockwell |
Equotip 550 Leeb |
Equotip Piccolo / Bambino 2 |
| Description | Equotip Live UCI creates new opportunities for collaboration in portable hardness testing. The Equotip iOS app allows you to conduct measurements at a remote location and provide instant access of your results to your team. | The world’s first full IoT portable wireless hardness testing solution with real-time data sharing, cloud backup and intuitive user interface. The ultra portable Equotip Live Leeb D impact device is perfect for use in confined spaces. | Flexible UCI hardness tester for fine-grained material with any shape and heat-treated surfaces. The patented adjustable test load enables a wide range of applications. Rugged touchscreen with enhanced software features and analysis functions. Equotip 540 for regular basic usage without extensive reporting needs. | Portable Rockwell hardness tester for scratch-sensitive, polished and thin parts. It features excellent sensitivity through small penetration of a few micrometer. Rugged touchscreen with enhanced software features and analysis functions. | Versatile Leeb hardness tester for on-site testing of heavy, large or installed parts. Rugged touchscreen designed to provide an exceptional user experience and best possible measuring and analysis. Enhanced software features and analysis functions. Equotip 540 for regular basic usage without extensive reporting needs. | Fully integrated and handy Leeb hardness tester with a compact and robust housing. Ideally suited for quick on-site hardness tests. Optional DL probe for confined spaces and recessed surfaces. Equotip Piccolo 2 allows the transfer of the data to a PC. |
| Your Benefits |
Wireless UCI probe Instantly share your measurements and reports Logbook for full data traceability |
Wireless impact device and clean user-interface Easily share your measurements and reports in real-time worldwide Logbook for full data traceability and to add media |
Combine with Leeb and Portable Rockwel On-screen feedback to reduce measurement inaccuracies caused by the operator Ready-to-go reports through powerful built-in reporting feature |
Combine with Leeb and UCI Equally reliable, accurate and standardized but faster than stationary Rockwell hardness testers Ready-to-go reports through powerful built-in reporting feature |
Use full Leeb probe portfolio and combine with Portable Rockwell and UCI Comes with the high accuracy known for all Equotip products Ready-to-go reports through powerful built-in reporting feature |
Entry model for quick on-site tests Compact housing and automatic angle correction allow flexible use Comes with the high accuracy known for all Equotip products |
| Native Scale | HV (UCI) | HL | HV (UCI) | µm, µinch | HL | HL |
| Measuring Range | 20 – 2000 HV | 150 – 950 HL | 20 – 2000 HV | 0 – 100 µm; 19 – 70 HRC; 35 – 1‘000 HV | 150 – 950 HL | 150 – 950 HL |
| Measuring Accuracy | ± 2% (150 – 950 HV) | ± 4 HL (0.5% at 800 HL) | ± 2% (150 – 950 HV) | ± 0.8 µm; ~ ± 1.0 HRC | ± 4 HL (0.5% at 800 HL) | ± 4 HL (0.5% at 800 HL) |
| Available Scales | HB, HV, HLD, HRA, HRB, HRC, HR15N, HR15T, MPA | HB, HV, HRB, HRC, HS, MPA | HB, HV, HRA, HRB, HRC, HR15N, HR15T, MPA | HB, HV, HRA, HRB, HRC, R15N, HR15T, HMMRC, MPA | HB, HV, HRA, HRB, HRC, HS, MPA | HB, HV, HRB, HRC, HS, MPA (Equotip Piccolo 2 only) |
| Available Probes | Universal probe with adjustable test load between HV1 and HV10 | Leeb D | UCI (Adjustable HV1 – HV5) | Portable Rockwell Probe 50N (can also be connected directly to PC) | Leeb D / DC / DL / S / E / G / C | Leeb D / DL |
| Combination With Other Methods | Leeb, Portable Rockwell | Leeb, UCI | Portable Rockwell, UCI | |||
| Average Roughness Ra (µm / µinch) | 12.5 / 500 | 2 / 80 | 12.5 / 500 | 2 / 80 | 7 / 275 (Leeb G) | 2 / 80 |
| Minimum Mass (kg / lbs) | 0.3 / 0.66 | 0.05 / 0.2 | 0.3 / 0.66 | No requirement | 0.02 / 0.045 (Leeb C) | 0.05 / 0.2 |
| Minimum Thickness (mm / inch) | 5 / 0.2 | 3 / 0.12 | 5 / 0.2 | 10 x indendation depth | 1 / 0.04 (Leeb C) | 3 / 0.12 |
| Applications | ||||||
| Standard to Large Objects | √ | √ | √ | √ | √ | √ |
| Round Objects | √ | √ | √ | In combination with support rings | In combination with support rings | |
| Light Objects | √ | x | √ | √ | With impact device Leeb C | x |
| Very Hard Object | √ | x | √ | √ | With impact devices Leeb S and E | x |
| Cast Objects | x | x | x | x | With impact device Leeb G | x |
| Polished Objects | √ | x | √ | √ | With impact device Leeb C | x |
| Limited Accessibility | x | x | x | x | With impact devices Leeb DC and DL | With impact device Leeb DL |
| Thin objects | x | x | x | √ | x | x |
| Heat Treated Surfaces | √ | x | √ | x | x | x |
| Additional appliances |
|
|
|
|||
| Features | ||||||
| Instrument Firmware |
|
|
|
|
|
|
| PC Software | Webbrowser-based Equotip Live solution | Webbrowser-based Equotip Live solution | Equotip Link allowing direct reporting and custom reports | Equotip Link allowing direct reporting and custom reports | Equotip Link allowing direct reporting and custom reports | Piccolink software (Equotip Piccolo 2 only) |
| Display | Any compatible Apple® iPad (iOS 8.0 and higher) | Any iOS device (not included in the delivery) | 7” color rugged touchscreen unit (800 x 480 pixels) with dual core processor | 7” color rugged touchscreen unit (800 x 480 pixels) with dual core processor | 7” color rugged touchscreen unit (800 x 480 pixels) with dual core processor | Monochrome 4-digit |
| Memory | Memory of iOS device | Memory of iOS device | Internal 8 GB flash memory (> 1’000’000 measurements) | Internal 8 GB flash memory (> 1’000’000 measurements) | Internal 8 GB flash memory (> 1’000’000 measurements) | 32 KB (~ 2’000 readings) (Equotip Piccolo 2 only) |
| Connections | USB for charging and updates | USB for charging and updates | USB host / device and Ethernet | USB host / device and Ethernet | USB host / device and Ethernet | USB interface to PC |
| Standardization | ||||||
| Standards |
|
|
|
|
|
|
| Guidlines |
|
|
|
|
|
|
| Accessories | ||||||
| Measuring Accessories |
|
|
|
|
|
|
| Verification Tools | Equotip Test Block D/DC, ~775 HLD / ~56 HRC, Factory Calibrations by Proceq (357 13 100) | Equotip UCI Test Block ~850HV, ISO 6507-3 HV5 Calibration (357 54 100) | Equotip Portable Rockwell Test Block ~62 HRC, ISO 6508-3 HRC Calibration (357 44 100) |
|
Equotip Test Block D/DC, ~775 HLD / ~56 HRC, Proceq Factory Calibration (357 13 100)
|